Zheng Fang, Xiaoyang Wang, Haocheng Li, Jiejie Liu, Qiugui Hu, Jimin Xiao. FastRecon: Few-shot Industrial Anomaly Detection via Fast Feature Reconstruction. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 17435-17444, IEEE, 2023. [doi]
Abstract is missing.