Bai Hong Fang, Qiang Xu, Nicola Nicolici. Hardware/Software Co-testing of Embedded Memories in Complex SOCs. In 2003 International Conference on Computer-Aided Design (ICCAD 03), November 9-13, 2003, San Jose, CA, USA. pages 599-606, IEEE Computer Society / ACM, 2003. [doi]
@inproceedings{FangXN03,
title = {Hardware/Software Co-testing of Embedded Memories in Complex SOCs},
author = {Bai Hong Fang and Qiang Xu and Nicola Nicolici},
year = {2003},
doi = {10.1145/996070.1009951},
url = {http://doi.acm.org/10.1145/996070.1009951},
tags = {embedded software, testing},
researchr = {https://researchr.org/publication/FangXN03},
cites = {0},
citedby = {0},
pages = {599-606},
booktitle = {2003 International Conference on Computer-Aided Design (ICCAD 03), November 9-13, 2003, San Jose, CA, USA},
publisher = {IEEE Computer Society / ACM},
isbn = {1-58113-762-1},
}