TSV-Defect Modeling, Detection and Diagnosis Based on 3-D Full Wave Simulation and Parametric Measurement

Xu Fang, Yang Yu, Kangkang Xu, Xiyuan Peng. TSV-Defect Modeling, Detection and Diagnosis Based on 3-D Full Wave Simulation and Parametric Measurement. IEEE Access, 6:72415-72426, 2018. [doi]

Abstract

Abstract is missing.