M. Faqir, G. Verzellesi, Fausto Fantini, Francesca Danesin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, A. Touboul, Christian Dua. Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. Microelectronics Reliability, 47(9-11):1639-1642, 2007. [doi]
Abstract is missing.