Hamed Farbeh, Amir Mahdi Hosseini Monazzah. CLEAR: Cache Lines Error Accumulation Reduction by exploiting invisible accesses. Microelectronics Journal, 90:123-132, 2019. [doi]
@article{FarbehM19,
title = {CLEAR: Cache Lines Error Accumulation Reduction by exploiting invisible accesses},
author = {Hamed Farbeh and Amir Mahdi Hosseini Monazzah},
year = {2019},
doi = {10.1016/j.mejo.2019.05.020},
url = {https://doi.org/10.1016/j.mejo.2019.05.020},
researchr = {https://researchr.org/publication/FarbehM19},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {90},
pages = {123-132},
}