Hassan Farhat, Mansour Zand, Hossein Saiedian. Estimating testability and coverage distributions of a VLSI circuit from a mixture of discrete and continuous functions. In Hal Berghel, Ed Deaton, George E. Hedrick, David Roach, Roger L. Wainwright, editors, Proceedings of the 1992 ACM/SIGAPP Symposium on Applied Computing: Technological Challenges of the 1990's, Kansas City, MO, USA, March 1-3, 1992. pages 433-437, ACM, 1992. [doi]
@inproceedings{FarhatZS92, title = {Estimating testability and coverage distributions of a VLSI circuit from a mixture of discrete and continuous functions}, author = {Hassan Farhat and Mansour Zand and Hossein Saiedian}, year = {1992}, doi = {10.1145/143559.143672}, url = {http://doi.acm.org/10.1145/143559.143672}, researchr = {https://researchr.org/publication/FarhatZS92}, cites = {0}, citedby = {0}, pages = {433-437}, booktitle = {Proceedings of the 1992 ACM/SIGAPP Symposium on Applied Computing: Technological Challenges of the 1990's, Kansas City, MO, USA, March 1-3, 1992}, editor = {Hal Berghel and Ed Deaton and George E. Hedrick and David Roach and Roger L. Wainwright}, publisher = {ACM}, isbn = {0-89791-502-X}, }