Hassan Farhat, Mansour Zand, Hossein Saiedian. Estimating testability and coverage distributions of a VLSI circuit from a mixture of discrete and continuous functions. In Hal Berghel, Ed Deaton, George E. Hedrick, David Roach, Roger L. Wainwright, editors, Proceedings of the 1992 ACM/SIGAPP Symposium on Applied Computing: Technological Challenges of the 1990's, Kansas City, MO, USA, March 1-3, 1992. pages 433-437, ACM, 1992. [doi]
Abstract is missing.