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On Comment Patterns that are Good Indicators of the Presence of Self-Admitted Technical Debt and those that Lead to False Positive Items

Mário Farias, Thiago Souto Mendes, Manoel G. Mendonça, Rodrigo O. Spínola. On Comment Patterns that are Good Indicators of the Presence of Self-Admitted Technical Debt and those that Lead to False Positive Items. In Yolande E. Chan, Maric Boudreau, Benoit Aubert, Guy Paré, Wynne Chin, editors, 27th Americas Conference on Information Systems, AMCIS 2021, Virtual Conference, August 9-13, 2021. Association for Information Systems, 2021. [doi]

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