John Faricelli. Layout-dependent proximity effects in deep nanoscale CMOS. In Jacqueline Snyder, Rakesh Patel, Tom Andre, editors, IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings. pages 1-8, IEEE, 2010. [doi]
@inproceedings{Faricelli10,
title = {Layout-dependent proximity effects in deep nanoscale CMOS},
author = {John Faricelli},
year = {2010},
doi = {10.1109/CICC.2010.5617407},
url = {http://dx.doi.org/10.1109/CICC.2010.5617407},
researchr = {https://researchr.org/publication/Faricelli10},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings},
editor = {Jacqueline Snyder and Rakesh Patel and Tom Andre},
publisher = {IEEE},
isbn = {978-1-4244-5758-8},
}