Comparative study of FinFETs versus 22nm bulk CMOS technologies: SRAM design perspective

Hooman Farkhani, Ali Peiravi, Jens Kargaard Madsen, Farshad Moradi. Comparative study of FinFETs versus 22nm bulk CMOS technologies: SRAM design perspective. In 27th IEEE International System-on-Chip Conference, SOCC 2014, Las Vegas, NV, USA, September 2-5, 2014. pages 449-454, IEEE, 2014. [doi]

Abstract

Abstract is missing.