Michele Favalli, Cecilia Metra. Online Testing Approach for Very Deep-Submicron ICs. IEEE Design & Test of Computers, 19(2):16-23, 2002. [doi]
@article{FavalliM02,
title = {Online Testing Approach for Very Deep-Submicron ICs},
author = {Michele Favalli and Cecilia Metra},
year = {2002},
doi = {10.1109/54.990438},
url = {http://doi.ieeecomputersociety.org/10.1109/54.990438},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/FavalliM02},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {19},
number = {2},
pages = {16-23},
}