Fault simulation for general FCMOS ICs

Michele Favalli, Piero Olivo, Bruno Riccò, Fabio Somenzi. Fault simulation for general FCMOS ICs. J. Electronic Testing, 2(2):181-190, 1991. [doi]

Authors

Michele Favalli

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Piero Olivo

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Bruno Riccò

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Fabio Somenzi

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