Yield prediction for 3D capacitive interconnections - researchr publication authors

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Alberto Fazzi, L. Magagni, Mario de Dominicis, Paolo Zoffoli, Roberto Canegallo, Pier Luigi Rolandi, Alberto L. Sangiovanni-Vincentelli, Roberto Guerrieri. Yield prediction for 3D capacitive interconnections. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 809-814, ACM, 2006. [doi]

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