Jianwei Fei, Yunshu Dai, Peipeng Yu, Tianrun Shen, Zhihua Xia, Jian Weng 0001. Learning Second Order Local Anomaly for General Face Forgery Detection. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 20238-20248, IEEE, 2022. [doi]
Abstract is missing.