Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff. Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electronic Testing, 14(1-2):125-131, 1999. [doi]
@article{FeigePWTK99,
title = {Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach},
author = {Chris Feige and Jan Ten Pierick and Clemens Wouters and Ronald J. W. T. Tangelder and Hans G. Kerkhoff},
year = {1999},
doi = {10.1023/A:1008313726031},
url = {http://dx.doi.org/10.1023/A:1008313726031},
tags = {architecture, testing, systematic-approach},
researchr = {https://researchr.org/publication/FeigePWTK99},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {14},
number = {1-2},
pages = {125-131},
}