Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018

Robert Feldt, Shin Yoo. Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018. Softw. Test., Verif. Reliab., 31(1-2), 2021. [doi]

Authors

Robert Feldt

This author has not been identified. Look up 'Robert Feldt' in Google

Shin Yoo

This author has not been identified. Look up 'Shin Yoo' in Google