Robert Feldt, Shin Yoo. Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018. Softw. Test., Verif. Reliab., 31(1-2), 2021. [doi]
@article{FeldtY21, title = {Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018}, author = {Robert Feldt and Shin Yoo}, year = {2021}, doi = {10.1002/stvr.1764}, url = {https://doi.org/10.1002/stvr.1764}, researchr = {https://researchr.org/publication/FeldtY21}, cites = {0}, citedby = {0}, journal = {Softw. Test., Verif. Reliab.}, volume = {31}, number = {1-2}, }