Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

Andreas Fellner, Willibald Krenn, Rupert Schlick, Thorsten Tarrach, Georg Weissenbacher. Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search. ACM Trans. Embedded Comput. Syst., 18(1), 2019. [doi]

Authors

Andreas Fellner

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Willibald Krenn

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Rupert Schlick

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Thorsten Tarrach

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Georg Weissenbacher

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