Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search

Andreas Fellner, Willibald Krenn, Rupert Schlick, Thorsten Tarrach, Georg Weissenbacher. Model-based, Mutation-driven Test-case Generation Via Heuristic-guided Branching Search. ACM Trans. Embedded Comput. Syst., 18(1), 2019. [doi]

Abstract

Abstract is missing.