Optimization of analog IC test structures

Eric Felt, Alberto L. Sangiovanni-Vincentelli. Optimization of analog IC test structures. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 48-53, IEEE Computer Society, 1996. [doi]

Authors

Eric Felt

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Alberto L. Sangiovanni-Vincentelli

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