Min Feng, Rajiv Gupta. Learning universal probabilistic models for fault localization. In Sorin Lerner, Atanas Rountev, editors, Proceedings of the 9th ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering, PASTE 10, Toronto, Ontario, Canada, June 5-6, 2010. pages 81-88, ACM, 2010. [doi]
@inproceedings{FengG10,
title = {Learning universal probabilistic models for fault localization},
author = {Min Feng and Rajiv Gupta},
year = {2010},
doi = {10.1145/1806672.1806688},
url = {http://doi.acm.org/10.1145/1806672.1806688},
researchr = {https://researchr.org/publication/FengG10},
cites = {0},
citedby = {0},
pages = {81-88},
booktitle = {Proceedings of the 9th ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering, PASTE 10, Toronto, Ontario, Canada, June 5-6, 2010},
editor = {Sorin Lerner and Atanas Rountev},
publisher = {ACM},
isbn = {978-1-4503-0082-7},
}