Learning universal probabilistic models for fault localization

Min Feng, Rajiv Gupta. Learning universal probabilistic models for fault localization. In Sorin Lerner, Atanas Rountev, editors, Proceedings of the 9th ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering, PASTE 10, Toronto, Ontario, Canada, June 5-6, 2010. pages 81-88, ACM, 2010. [doi]

Abstract

Abstract is missing.