Jianhua Feng, Guoliang Li. A Test Data Compression Method for System-on-a-Chip. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 270-273, IEEE Computer Society, 2008. [doi]
@inproceedings{FengL08:1,
title = {A Test Data Compression Method for System-on-a-Chip},
author = {Jianhua Feng and Guoliang Li},
year = {2008},
doi = {10.1109/DELTA.2008.30},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.30},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/FengL08%3A1},
cites = {0},
citedby = {0},
pages = {270-273},
booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008},
publisher = {IEEE Computer Society},
}