Analysis of the Lift-Off Effect in Motion-Induced Eddy Current Testing Based on Semi-Analytical Model

Bo Feng 0001, Shuangnan Xie, Lian Xie, Kangxuan Deng, Shenghan Wang, Yihua Kang. Analysis of the Lift-Off Effect in Motion-Induced Eddy Current Testing Based on Semi-Analytical Model. IEEE T. Instrumentation and Measurement, 73:1-8, 2024. [doi]

Abstract

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