Yi Feng 0002, Zheng Zhou, Dong Tong, Xu Cheng. Clock domain crossing fault model and coverage metric for validation of SoC design. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1385-1390, ACM, 2007. [doi]
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