Jack Ferguson. Finding I/O Faults on In-Circuit ICs Using Parasitic Transistor Tests. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 926, IEEE Computer Society, 1995.
@inproceedings{Ferguson95:1,
title = {Finding I/O Faults on In-Circuit ICs Using Parasitic Transistor Tests},
author = {Jack Ferguson},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/Ferguson95%3A1},
cites = {0},
citedby = {0},
pages = {926},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}