Vasco R. Fernandes, Carlos M. S. Vicente, E. Pecoraro, Naoya Wada, Paulo S. Andre, Rute A. S. Ferreira. Refractive index characterization of waveguide channels using spectroscopic ellipsometry. In Proceedings of EUROCON 2011, International Conference on Computer as a Tool, 27-29 April 2011, Lisbon, Portugal. pages 1-4, IEEE, 2011. [doi]
Abstract is missing.