Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners

David Blanco Fernandez, Pedro Fernández, A. Noriega, Braulio Jose Alvarez, Gonzalo Valiño. Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors, 20(1):1, 2020. [doi]

Abstract

Abstract is missing.