Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
R. Fernández, R. Rodríguez, M. Nafría, X. Aymerich. Effect of oxide breakdown on RS latches. Microelectronics Reliability, 47(4-5):581-584, 2007. [doi]
No references recorded for this publication.
No citations of this publication recorded.