Eduardo B. Fernández, Nobukazu Yoshioka, Hironori Washizaki, Michael VanHilst. Measuring the Level of Security Introduced by Security Patterns. In ARES 2010, Fifth International Conference on Availability, Reliability and Security, 15-18 February 2010, Krakow, Poland. pages 565-568, IEEE Computer Society, 2010. [doi]
Abstract is missing.