Fabrizio Ferrandi, Franco Fummi, Laura Pozzi, Mariagiovanna Sami. Configuration-Specific Test Pattern Extraction for Field Programmable Gate Arrays. In 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France. pages 85-93, IEEE Computer Society, 1997. [doi]
Abstract is missing.