Identification of process/design issues during 0.18 µm technology qualification for space application - researchr publication authors

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Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis. Identification of process/design issues during 0.18 µm technology qualification for space application. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 989-993, ACM, 2007. [doi]

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