Ruggero Feruglio, Fernanda Irrera, Bruno Riccò. Microscopic aspects of defect generation in SiO::2::. Microelectronics Reliability, 42(9-11):1427-1432, 2002. [doi]
@article{FeruglioIR02,
title = {Microscopic aspects of defect generation in SiO::2::},
author = {Ruggero Feruglio and Fernanda Irrera and Bruno Riccò},
year = {2002},
doi = {10.1016/S0026-2714(02)00163-4},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00163-4},
researchr = {https://researchr.org/publication/FeruglioIR02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1427-1432},
}