Imad A. Ferzli, Farid N. Najm. Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations. In 2003 International Conference on Computer-Aided Design (ICCAD 03), November 9-13, 2003, San Jose, CA, USA. pages 770-777, IEEE Computer Society / ACM, 2003. [doi]
@inproceedings{FerzliN03:0,
title = {Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations},
author = {Imad A. Ferzli and Farid N. Najm},
year = {2003},
doi = {10.1145/996070.1009975},
url = {http://doi.acm.org/10.1145/996070.1009975},
researchr = {https://researchr.org/publication/FerzliN03%3A0},
cites = {0},
citedby = {0},
pages = {770-777},
booktitle = {2003 International Conference on Computer-Aided Design (ICCAD 03), November 9-13, 2003, San Jose, CA, USA},
publisher = {IEEE Computer Society / ACM},
isbn = {1-58113-762-1},
}