Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui. Defects, Fault Modeling, and Test Development Framework for RRAMs. JETC, 18(3), 2022. [doi]
@article{FiebackMWABTH22,
title = {Defects, Fault Modeling, and Test Development Framework for RRAMs},
author = {Moritz Fieback and Guilherme Cardoso Medeiros and Lizhou Wu and Hassen Aziza and Rajendra Bishnoi and Mottaqiallah Taouil and Said Hamdioui},
year = {2022},
doi = {10.1145/3510851},
url = {https://doi.org/10.1145/3510851},
researchr = {https://researchr.org/publication/FiebackMWABTH22},
cites = {0},
citedby = {0},
journal = {JETC},
volume = {18},
number = {3},
}