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Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui. Defects, Fault Modeling, and Test Development Framework for RRAMs. JETC, 18(3), 2022. [doi]

The following publications are possibly variants of this publication:

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