Filipe Figueiredo, Steven Liu. Reduced Model based Fault Detection and Isolation with Residual Threshold Determination. In 2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018. pages 5007-5012, IEEE, 2018. [doi]
@inproceedings{FigueiredoL18-0, title = {Reduced Model based Fault Detection and Isolation with Residual Threshold Determination}, author = {Filipe Figueiredo and Steven Liu}, year = {2018}, doi = {10.23919/ACC.2018.8431405}, url = {https://doi.org/10.23919/ACC.2018.8431405}, researchr = {https://researchr.org/publication/FigueiredoL18-0}, cites = {0}, citedby = {0}, pages = {5007-5012}, booktitle = {2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018}, publisher = {IEEE}, isbn = {978-1-5386-5428-6}, }