John L. Fike. Predicting fault detectability in combinational circuits - a new design tool?. In Robert B. Hitchcock Sr., Donald J. Humcke, Stephen A. Szygenda, editors, Proceedings of the 12th Design Automation Conference, DAC '75, Boston, Massachusetts, USA, June 23-25, 1975. pages 290-295, ACM, 1975. [doi]
Abstract is missing.