Bettina Finzel, Judith Knoblach, Anna Magdalena Thaler, Ute Schmid. Near Hit and Near Miss Example Explanations for Model Revision in Binary Image Classification. In Vicente Julián, David Camacho, Hujun Yin, Juan M. Alberola, Vitor Beires Nogueira, Paulo Novais, Antonio J. Tallón-Ballesteros, editors, Intelligent Data Engineering and Automated Learning - IDEAL 2024 - 25th International Conference, Valencia, Spain, November 20-22, 2024, Proceedings, Part II. Volume 15347 of Lecture Notes in Computer Science, pages 260-271, Springer, 2024. [doi]
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