P. Fiorenza, R. Lo Nigro, V. Raineri, S. Lombardo, R. G. Toro, G. Malandrino, I. L. Fragalà. Defects induced anomalous breakdown kinetics in Pr::2::O::3:: by micro- and nano-characterization. Microelectronics Reliability, 47(4-5):640-644, 2007. [doi]
Abstract is missing.