J. Torras Flaquer, Jean-Marc Daveau, Lirida A. B. Naviner, Philippe Roche. Fast reliability analysis of combinatorial logic circuits using conditional probabilities. Microelectronics Reliability, 50(9-11):1215-1218, 2010. [doi]
@article{FlaquerDNR10,
title = {Fast reliability analysis of combinatorial logic circuits using conditional probabilities},
author = {J. Torras Flaquer and Jean-Marc Daveau and Lirida A. B. Naviner and Philippe Roche},
year = {2010},
doi = {10.1016/j.microrel.2010.07.058},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.058},
tags = {analysis, logic, reliability},
researchr = {https://researchr.org/publication/FlaquerDNR10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1215-1218},
}