Diagnostic Tests and Diagnosis for Delay Faults Using Path Segmentation

Tino Flenker, André Sülflow, Görschwin Fey. Diagnostic Tests and Diagnosis for Delay Faults Using Path Segmentation. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 145-150, IEEE, 2015. [doi]

Authors

Tino Flenker

This author has not been identified. Look up 'Tino Flenker' in Google

André Sülflow

This author has not been identified. Look up 'André Sülflow' in Google

Görschwin Fey

This author has not been identified. Look up 'Görschwin Fey' in Google