Design for sequential testability: an internal state reseeding approach for 100 fault coverage - researchr publication authors

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Marie-Lise Flottes, Christian Landrault, A. Petitqueux. Design for sequential testability: an internal state reseeding approach for 100 fault coverage. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 404, IEEE Computer Society, 2000. [doi]

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