Design for sequential testability: an internal state reseeding approach for 100 fault coverage

Marie-Lise Flottes, Christian Landrault, A. Petitqueux. Design for sequential testability: an internal state reseeding approach for 100 fault coverage. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 404, IEEE Computer Society, 2000. [doi]

@inproceedings{FlottesLP00,
  title = {Design for sequential testability: an internal state reseeding approach for 100   fault coverage},
  author = {Marie-Lise Flottes and Christian Landrault and A. Petitqueux},
  year = {2000},
  url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870404abs.htm},
  tags = {test coverage, testing, design, coverage, systematic-approach},
  researchr = {https://researchr.org/publication/FlottesLP00},
  cites = {0},
  citedby = {0},
  pages = {404},
  booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-0887-1},
}