Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing

Konrad Fögen, Horst Lichter. Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing. In 13th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2020, Porto, Portugal, October 24-28, 2020. pages 171-180, IEEE, 2020. [doi]

Abstract

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