Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp

A. Fontana, S. M. Pazos, F. L. Aguirre, F. Palumbo, Nahuel Vega, N. A. Muller, E. de la Fourniere, Mario Debray. Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. In 31st Symposium on Integrated Circuits and Systems Design, SBCCI 2018, Bento Gonçalves, RS, Brazil, August 27-31, 2018. pages 1-5, IEEE, 2018. [doi]

Abstract

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