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Abel Fontserè, A. Pérez-Tomás, Philippe Godignon, José Millán, H. De Vleeschouwer, J. M. Parsey, P. Moens. 2·AlGaN/GaN MIS-HEMTs. Microelectronics Reliability, 52(9-10):2220-2223, 2012. [doi]
Abstract is missing.