2·AlGaN/GaN MIS-HEMTs

Abel Fontserè, A. Pérez-Tomás, Philippe Godignon, José Millán, H. De Vleeschouwer, J. M. Parsey, P. Moens. 2·AlGaN/GaN MIS-HEMTs. Microelectronics Reliability, 52(9-10):2220-2223, 2012. [doi]

Abstract

Abstract is missing.