Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage

Freddy Forero, Andres F. Gomez, VĂ­ctor H. Champac. Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage. J. Low Power Electronics, 12(4):395-402, 2016. [doi]

Abstract

Abstract is missing.