A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage - researchr publication authors

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Freddy Forero, Andres Gomez, Victor H. Champac. A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage. In 17th Latin-American Test Symposium, LATS 2016, Foz do Iguacu, Brazil, April 6-8, 2016. pages 81-86, IEEE, 2016. [doi]

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