Freddy Forero, Jean Marc Gallière, Michel Renovell, Víctor H. Champac. Detectability Challenges of Bridge Defects in FinFET Based Logic Cells. J. Electronic Testing, 34(2):123-134, 2018. [doi]
@article{ForeroGRC18,
title = {Detectability Challenges of Bridge Defects in FinFET Based Logic Cells},
author = {Freddy Forero and Jean Marc Gallière and Michel Renovell and Víctor H. Champac},
year = {2018},
doi = {10.1007/s10836-018-5714-0},
url = {https://doi.org/10.1007/s10836-018-5714-0},
researchr = {https://researchr.org/publication/ForeroGRC18},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {2},
pages = {123-134},
}